Job Description

  • Work with front -end team, DFT, and cross -functional teams to provide the solutions and make sure DFT DRCs are fixed
  • Generating high -quality manufacturing ATPG test patterns for (SAF) stuck -at, transition fault (TDF), Path Delay fault (PDF) models and through the use of on -chip test compression techniques.

Requirements

  • BE/ BTech/ MTech/MS/ PhD inΒ Electronics, Electrical, Computer Engineering or Computer Science Engineering with years of exp.
  • Highly motivated and driven to face challenging design and debug problems
  • In -depth knowledge and hands -on experience in scan insertion, ATPG, coverage analysis, and Transition delay test coverage analysis.
  • Analyze the design and propose the best compression technique.
    ...

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